Summary
Dive into the fascinating thin film material analysis world through the powerful X-ray diffraction (XRD) and electron microscopy (EM) techniques. Explore the fundamentals, practical applications, and hands-on skills needed for basic crystal structure determination and electron imaging. Within this module, the basic principles of the methods, as well as helpful insights on data interpretation and valuable applications, will be provided. Whether you are a scientist, researcher, or enthusiast new to these techniques, this course will enable your skills in conceiving XRD and EM data.
Topics
- Basic principle of using X-rays for producing diffraction data (Bragg’s law)
- Overview on different XRD techniques (different sources and geometries)
- Data interpretation and useful methods for your daily business with X-ray diffraction (texture coefficients, FWHM, sin²psi, etc.)
- Using electrons in imagining techniques
- Physical limits and length scales in EM techniques: Fundamentals and overview for essential methods (for SEM, SE & BSE, and in TEM, BF & DF, SAED)
- Chemical analysis using EM techniques (focus on EDX)
- Sample preparation and EM data assessment
Instructor
Helmut Riedl
Assistant Professor in Surface Engineering
Technische Universität Wien, Austria
